1Calibration Method of Thermal Resistance Tester Based on Electrical MethodZHAI Yuwei, ZHENG Shiqi, CHENG Xiaohui, LI Yinghui1-3,1492Whole Calibration Method of High-precision Noise Coefficient Measurement SystemWU Aihua, SUN Jing, LIU Chen, LIANG Faguo, ZHENG Yanqiu4-6,283Calibration Method Research on Electronic Component Solderability TesterMA Qingtao, ZHANG Ji, YANG Cheng, PAN Lingyu7-9,794Architecture Design of Mixed Signal Integrated Circuit Test System Calibration EquipmentLI Xuanmian, LIU Qian, HU Yong10-13,355Design and Characterization on Reference Materials of Digital Integrate CircuitHU Yong, LIU Qian, ZHOU Houping14-16,1546Micro-current Calibration Method of the Semi-conductor AnalyzerQIAO Yu'e, ZHENG Shiqi, LIANG Faguo, DING Liqiang17-20,437Special TRL Standards for Monolithic Transistors ModelingLIU Chen, SUN Jing, WU Aihua, LUAN Peng, ZHENG Yanqiu, LIANG Faguo21-23,748Uncertainty Evaluation of the Noise-Parameter Measurement with Monte Carlo MethodZHENG Shiqi, WU Aihua, LIANG Faguo24-289Automated Calibration Program Design of Overall Timing Accuracy of Automated Test EquipmentsLIU Qian, HU Yong, LI Xuanmian29-31,6910Hazard in Automatic Test SystemGU Yi32-3511Online Measurement Method of Automatic Integrated CircuitZHOU Houping36-38,13212Evaluation of Measurement Uncertainty for S-parameters Based on SOLT Calibration TechnologyHAN Zhiguo, LIANG Faguo, LUAN Peng, WU Aihua, LI Suoyin39-4313A High Accuracy Calibration Method of Picoampere and Nanoampere DC CurrentWANG Yibang, ZHENG Shiqi, WU Aihua, FU Shaohui44-4614The Scheme of On-wafer Vector Network Analyzer Test System Comparison of ValuesSUN Xiaoying, SUN Jing, LUAN Peng, WU Aihua, HAN Lihua, LIANG Faguo47-50,5815An Semi-automatic Calibration System for DC Power SuppliesLIU Yan, DING Liqiang, QIAO Yu'e, WU Aihua51-5316Evaluation of Uncertainty of Measurement of BC3193 Test SystemsZHANG Jianhong54-5817A Configuration Method of FPGA Interconnect Resources TestingWANG Xiangfen, GAO Cheng, HUANG Jiaoying, FU Chengcheng59-6418Research on Testing Technology of Logic Elements in FPGAQIU Yunfeng, QIN Ludong65-6919Direct-Digital-Synthesis Dedicated Silicon Static Parameter Testing MethodLIU Luyang, ZHANG Hong, ZHANG Bei, LV Bing70-7420Research of Delay-Fault Testing Technology in FPGAYANG Shining, GU Ying, SHI Xuemei75-79 