Hazard in Automatic Test System
GU Yi
Abstract：In the field of IC testing ,the accuracy reducing caused by the channel transmission delay in AC parameters testing cannot be avoided .Although the application of the time domain reflection technology can solve some problem ,it can not solve all .In this paper ,the Phenomenon of digital channel logic error is shown when happening after the transmission de‐lay is correction in Teradyne J750EX ,and the source is analyzed .
Keywords：automatic test systemdigital channelhazard
Publication Date：2015-01-01
Online Publishing Date：2025-08-15(First online date of this platform, not the publication date of the document)
Pages：4( 32-35 )