Direct-Digital-Synthesis Dedicated Silicon Static Parameter Testing Method
LIU Luyang
ZHANG Hong
ZHANG Bei
LV Bing
Abstract：The paper focuses on static parameter testing method of DAC embedded in DDS based on ATE .Due to the inherent characteristics of DDS dedicated silicon ,it can only output a certain frequency sine wave .Testing developers are on‐ly able to control the frequency and amplitude of the sine wave .But the sine‐wave voltage is non‐linear ,so the DAC tradi‐tional testing method using linear ramp voltage can not be used for static parameter testing of DDS dedicated silicon .The em‐bedded DAC static parameters testing can be only relied on indirect ways .In order to achieve the test automation of DAC em‐bedded in DDS chip ,the non‐linear amplitude information of the sine wave is converted to linear angle information in the test method .The experiments demonstrate that this method can achieve efficiently and reliably in actual application .
Keywords：direct digital synthesis dedicated silicondigital-to-analog converterlinear parameter
Publication Date：2015-01-01
Online Publishing Date：2025-08-15(First online date of this platform, not the publication date of the document)
Pages：5( 70-74 )