Research of Delay-Fault Testing Technology in FPGA
YANG Shining
GU Ying
SHI Xuemei
Abstract：With the fast application of FPGA devices ,the FPGA device fault testing and fault diagnosis method for a more comprehensive study is of great significance .The delay‐fault is an important type of FPGA interior faults .The FPGA delay‐fault includes interior logic resources delay and interior routing resources delay .Therefore ,the inter structure and de‐lay‐fault of FPGA are analyzed ,and the fault testing method for interior logic resources delay and interior routing resources delay are researched .The test approach is successfully implemented using one Virtex‐ Ⅱ FPGA of Xilinx .The realization of Delay‐Fault Testing technology in FPGAs is proved .
Keywords：FPGAdelay-faulttesting technology
Publication Date：2015-01-01
Online Publishing Date：2025-08-15(First online date of this platform, not the publication date of the document)
Pages：5( 75-79 )