Research on Testing Technology of Logic Elements in FPGA
QIU Yunfeng
QIN Ludong
Abstract：FPGA is widely used in the field of integrated circuit design, system on chip. With the extensive application of FPGA, the dependability of the FPGA is very complex, also it is harder and more expensive. The logic unit structure of type SRAM‐based FPGA is introdueced, and a traversal test method based on the scan chain is presented. As an example of Altera's Cyclone series FPGA, the implementation method of online configuration and function test of the FPGA in the VLSI Test System CATT‐400 is described.
Keywords：field programmable gate array(FPGA)logic elements(LE)scan chainpartial reconfigurationautomat-ic test system(ATE)
Publication Date：2015-01-01
Online Publishing Date：2025-08-15(First online date of this platform, not the publication date of the document)
Pages：5( 65-69 )