Preparation and Evaluation of Standard Sample of SiO2 Film ThicknessZHAO Lin, LIANG Faguo, HAN Zhiguo, LI Suoyin, FU Shaohui5-8,56
Automated Calibration Technology Research of High-speed Loadboard Based on LabVIEWSUN Chongjun, ZHANG Minghu9-11,18
Research of ATE Calibration Equipment Based on Reference Materials of Integrate CircuitXIAO Ying, HU Yong, ZHOU Houping12-14,225
TRL Calibration Technique in High Precision Microwave Fixture DesignREN Xiang, ZHANG Yizh, i LI Shuo, LI Jing15-18
Evaluation of Uncertainty in Measurement of Delay Time of Integrated Circuits Testing ResultLI Xiaohong, DENG Yongfang, ZHANG Liwei, CHEN Min, LI Zhen19-23
Serial Test Method of FPGA DDR Module Based on On-Chip LoopbackWANG He, ZHANG Dayu, WANG Yue, ZHANG Song24-28
Research on Typical Parameters Testing Technology of MEMS Inertial DevicesCHEN Bo, LIU Luyang, LV Bing, YANG Jingyang, LV Yue33-36,44
Research on Testing Techniques of High Speed Analog-to-Digital Converter RHF1201XU Weida, XU Daojing, LIU Wei, PAN Xiaoyu37-39,129
