Design of the Key Test Vectors for DDR
SHI Xuemei
LIU Dunwei
GU Ying
LI Shengjie
Abstract：Compared with other memory technologies,DDR(Double Data Rate)has the faster processing speed,the larger storage potential and the more affordable price. And for those reasons,more and more major manufacturers are used on the way to purchase this storage memory. In this paper,the operating principle and using process of DDR DRAM(Dynamic Random Access Memory)are recommended. After that,a test method about DDR DRAM is presented. This test technology focuses on the reason?able sequence,based on the ATE(Automatic Test Equipment)test vectors designing,and displays a useful,simple and universal test method.
Keywords：Key Words DDRtest vectortest method
Publication Date：2019-01-01
Online Publishing Date：2025-08-15(First online date of this platform, not the publication date of the document)
Pages：5( 29-32,78 )