Research on Testing Techniques of High Speed Analog-to-Digital Converter RHF1201

XU Weida; XU Daojing; LIU Wei; PAN Xiaoyu

doi:10.3969/j.issn.1672-9722.2019.01.010

Home>Articles>Research on Testing Techniques of High Speed Analog-to-Digital Converter RHF1201

DOI: 10.3969/j.issn.1672-9722.2019.01.010

Research on Testing Techniques of High Speed Analog-to-Digital Converter RHF1201

XU Weida

XU Daojing

LIU Wei

PAN Xiaoyu

Abstract：This paper introduces the characteristics of high speed analog-to-digital converter RHF1201,how to choose suit?able testing sources in the process of testing dynamic parameter development of the program,design interface circuit suitable for de?vice testing,and reduce the introduction of noise to satisfy the testing of dynamic parameters.

Keywords：Key Words ADCSNRSINADTHDSFDRENOBJitter

Publication Date：2019-01-01

Online Publishing Date：2025-08-15(First online date of this platform, not the publication date of the document)

Pages：4( 37-39,129 )

Computer and Digital Engineering

ISTIC

ISSN：1672-9722

Year, Vol.(Issue)：2019,47(1)