Evaluation of Uncertainty in Measurement of Delay Time of Integrated Circuits Testing Result
LI Xiaohong
DENG Yongfang
ZHANG Liwei
CHEN Min
LI Zhen
Abstract：The delay time of operational amplifier,switch driver and standard module are measured based on method Semicon?ductor devices Integrated circuits Part 2:Digital integrated circuits- GB/T17574-1998(the fourth chapter ,the third section). The uncertainty in measured results of delay time are evaluated in accordance with Evaluation and Expression of Uncertainty in Measure?ment-JJF1059.1-2012,Requirements for Measurement Uncertainty-CNAS-CL07-2011 and Guidance on evaluating the uncertain?ty in electrical apparatus testing-CNAS-GL06-2006.
Keywords：Key Words integrated circuitsdelay timeuncertainty
Publication Date：2019-01-01
Online Publishing Date：2025-08-15(First online date of this platform, not the publication date of the document)
Pages：5( 19-23 )