Simulating of depth analysis of atomprobe along vertical direction to grain boundary
ZHANG Jun-feng
LI Jiu-hui
Abstract：In order to resolve the difficulties of the FIM-AP sample preparation which contains a grain boundary along the vertical direction to axis and obtain the element distribution along the vertical directical boundary The article takes advantage of mathematical model and computer, the model of the element distribution along the vertical direction to grain boundary have been established, which according to non vertical direction to grain boundary,Using this model,The analysis for The chromium near the grain boundary sensitized Fe17Cr alloy have been made.
Machine-generated Keywords：
Publication Date：2001-01-01
Online Publishing Date：2025-08-15(First online date of this platform, not the publication date of the document)
Pages：3( 30-32 )