A multiple faults test generation algorithm for digital circuits based on artificial bee colony algorithm
ZHAO Ying
MA Zhan-hui
LI Yan-juan
Keywords：neural networksartificial bee colonyconstraint circuitenergy function
Publication Date：2016-01-01
Online Publishing Date：2025-08-15(First online date of this platform, not the publication date of the document)
Pages：7( 6-12 )