Study on Lifetime Testing of Near-Ultraviolet Light-Emitting Diodes(LEDs)
DENG Xikang
Abstract：In response to the issue of shortened service life of near-ultraviolet LEDs caused by light degradation of encapsulation materials and heat accumulation during long-term use,three types of LEDs with a peak wavelength of 360 nm were selected.By combining solder joint temperature analysis with degradation mechanism methods,a comparative study was conducted on the reliability differences between semi-inorganic encapsulation(quartz-silicone)and fully inorganic encapsulation(ceramic-metal),as well as between domestic and imported products.The experimental results provide data support for encapsulation process optimization and lifetime prediction.
Keywords：near-ultraviolet(UVA)light-emitting diode(LED)lifetimeradiant fluxthermal resistance
Publication Date：2025-10-31
Online Publishing Date：2025-11-27(First online date of this platform, not the publication date of the document)
Pages：6( 21-26 )