Accelerated Luminous Flux Depreciation Test and Reliability Assessment for LED Lighting Products
QIAN Cheng
FAN Jiajie
FAN Xuejun
YUAN Changan
ZHANG Guoqi
Abstract：By current reliability testing methods, the claim of such long lifetime operation requires an expensive and long period qualification test which restricts the development of LED industries.In this paper, based on an exponential-form degradation model with Arrhenius acceleration assumption, we develop an accelerated luminous flux depreciation test method.This proposed method reduces the test time from 6000 hours to 2000 hours, without the assistance of LM-80 test report of the LED sources nor the solder temperature.A number of numerical simulation and validation experiments on various LED lighting products show that the qualification results obtained by the proposed method agree well with those given by the Energy Star requirements.
Keywords：LED lighting productsluminous flux depreciationaccelerated testreliability assessment
Publication Date：2016-03-01
Online Publishing Date：2025-08-15(First online date of this platform, not the publication date of the document)
Pages：7( 43-48,63 )