Analysis of risk factors for lead dislocation in cardiac implantable electronic devices
Zhu Botao
Li Haiwei
Liu Yutong
Cui Naiyuan
Liu Huanfu
Sun Weiping
Qian Man
Yuan Zhongyu
Zhang Xiaoping
Wu Yongquan
Abstract：Objective To analyze the clinical risk factors of lead dislocation in cardiac implantable electronic devices(CIED).Methods A total of 78 patients with lead dislocation after CIED implantation due to arrhythmia from January 2013 to June 2024 in Beijing Anzhen Hospital,Capital Medical University were selected as the lead dislocation group.During the same period,137 patients with arrhythmia who did not have lead dislocation after CIED implantation were randomly selected as the non-dislocation group.The baseline characteristics,laboratory test results and ultrasound results of the two groups were compared.Logistic regression was used to analyze the clinical risk factors of lead dislocation.Results The patients in the lead dislocation group were younger than those in the non-dislocation group[(67±12)years vs(73±10)years],and the proportion of patients with atrioventricular block and cardiac interventional procedure history was higher in the dislocation group than in the non-dislocation group[46.2％(36/78)vs 10.9％(15/137),23.1％(18/78)vs 7.3％(10/137)](all P＜0.05).There were no significant differences in laboratory test results except alanine transaminase between the two groups(all P＞0.05).The left ventricular end-diastolic diameter and left ventricular end-systolic diameter in the lead dislocation group were larger than those in the non-dislocation group,and the left ventricular ejection fraction in the lead dislocation group was lower than that in the non-dislocation group(all P＜0.05).Multivariate binary Logistic regression analysis showed that higher left ventricular end-diastolic diameter(odds ratio=1.43),lower left ventricular ejection fraction(odds ratio=1.07)and history of atrioventricular block(odds ratio=16.74)were independently associated with increased risk of lead dislocation events(all P＜0.01).Conclusion Higher left ventricular end-diastolic diameter,lower left ventricular ejection fraction,and a history of atrioventricular block are independently associated with an increased risk of CIED lead dislocation events.
Keywords：Cardiac implantable electronic devicesLead dislocationLeft ventricular end diastolic dimensionLeft ventricular ejection fraction
Publication Date：2025-02-07
Online Publishing Date：2026-09-14(First online date of this platform, not the publication date of the document)
Pages：5( 166-170 )