LED Reliability Life Model and Application
TANG Zan
REN Yanyan
GONG Weibin
ZHANG Jiaxian
WU Jing
Abstract：Light-emitting diodes are widely used in indoor lighting,street lamps,advertising displays,decorative lighting and so on.Compared with traditional light sources,LED light sources have attracted people's interest because of their high efficiency,environmental benefits,high reliability and long life.For LED developers,using traditional destructive life tests that record failure data to estimate LED life is very time consuming and waste test resources.Therefore,it is necessary to calculate the service life in the application environment by conducting short-term and cost-effective high temperature aging tests combined with LED life models.This paper introduces several common LED life projection models,and uses Weibull distribution as the life model,combined with high-temperature aging test data to calculate the LED life in practical application environment.
Keywords：LED service lifereliabilityhigh temperature agingLED life modelLED test
Publication Date：2024-03-25
Online Publishing Date：2025-08-15(First online date of this platform, not the publication date of the document)
Pages：6( 22-26,43 )