The Current Status of Flicker Standards and the Application of Stroking Technology
HU Xun'an
ZHANG Zhou
XU Jiayu
Abstract：In this paper, fluctuation depth and flicker index are introduced to analyze the causes of strobe light, and the risk level of light source strobe is evaluated by fluctuation depth. By measuring and comparing the relationship between common circuit topology, ripple current ripple ratio and percent flicker, the advantages and disadvantages of various circuit topologies are analyzed. According to the existing standards and requirements at home and abroad, the lighting circuits of different markets are designed and developed in order to provide comfortable and safe lighting environment for consumers.
Keywords：strobefluctuation depthripple currentcircuit topology
Publication Date：2019-03-02
Online Publishing Date：2025-08-15(First online date of this platform, not the publication date of the document)
Pages：4( 36-39 )