Reliability optimization method for embedded electronic information system
BAI Xin
Lü Li-ping
WEI Lin
Abstract：Aiming at the problem that the traditional reliability optimization method always has the inaccurate optimization, a new reliability optimization method for embedded electronic information system was proposed.Through analyzing the working principle of embedded electronic information system, the fault density function, failure rate, average life and availability of embedded electronic information system were optimized, respectively.The reliability constraint model for embedded electronic information system was established, and the reliability parameters under the optimal condition were calculated.The test results show that when the optimization for the embedded system was performed with the reliability optimization method, the service life, modeling accuracy, availability of the system get improved, and the method has definite practicability.
Keywords：embedded typeelectronic information systemreliability optimizationcalculation methodmodelingdensity functionconstraint model
Publication Date：2017-07-02
Online Publishing Date：2025-08-15(First online date of this platform, not the publication date of the document)
Pages：5( 417-421 )