Improving Blast Resistance of Rice CMS Line Taifeng A by Pigm-Based Marker-Assisted Selection Strategy
Deng Jiqi
Huang Jun
Che Fanhao
Zou Yuying
Zhou Geng
Guo Chenglong
Shen Qiang
Li Jiaxin
Liu Jinling
Liu Xionglun
Abstract:To orderly improve the resistance of rice CMS line Taifeng A to rice blast disease,we selected the rice cultivar Gumei 4,known for harboring the broad-spectrum and durable blast resistance gene Pigm,as the donor parent,and employed the maintainer line Taifeng B and its sterile line Taifeng A as the recipient parents,to conduct molecular marker-assisted selection utilizing the selected codominant marker S29742 loca-ted within the Pigm gene.In the Gumei 4 genome,the marker S29742 yielded a 554-bp amplification product,contrasting with a 745-bp product observed in the genomes of Taifeng A and Taifeng B,indicating a pro-nounced polymorphism.By selecting with marker S29742 and integrating field and laboratory identification of resistance to rice blast seedling blight,we successfully screened out two improved sterile lines,Taifeng A-Pigm-1 and Taifeng A-Pigm-2,along with their respective maintainer lines,Taifeng B-Pigm-1 and Taifeng B-Pigm-2.Through evaluations of fertility,agronomic traits and grain quality,we ultimately identified the refined sterile line Taifeng A-Pigm-1,characterized by high resistance to blast disease,significant sterility,stable ste-rility,favorable outcrossing habits and superior agronomic attributes,accompanied by its compatible maintai-ner line Taifeng B-Pigm-1.The results established a foundation for the continued development of new hybrid rice combinations with broad-spectrum,high-level resistance to rice blast disease.
Keywords:Taifeng ACytoplasmic male sterile(CMS)lineRice blast resistancePigm geneMarker assisted selection(MAS)
Publication Date:2025-10-30
Online Publishing Date:2026-05-22(First online date of this platform, not the publication date of the document)
Pages:8( 28-35 )
Shandong Agricultural Sciences

Shandong Agricultural Sciences

ISTICPKU
ISSN:1001-4942
Year, Vol.(Issue):2025,57(10)