Reliability growth prediction of mine-used low-voltage switchgear
XIA Haoxuan
LIU Zixu
WANG Jingqin
YANG Chunwen
WANG Li
Keywords：low-voltage switchgearreliability growth predictionBayes methodMTBF
Publication Date：2015-01-01
Online Publishing Date：2025-08-15(First online date of this platform, not the publication date of the document)