Study of the Measurement of the Thickness of Aluminum-Silicon Permeability Layer Based on X-Ray Fluorescence

Home>Articles>Study of the Measurement of the Thickness of Aluminum-Silicon Permeability Layer Based on X-Ray Fluorescence

YU Jiabo

WANG Cheng

QU Yi

LI Qiuliang

Keywords：X-ray fluorescence detectionmultielement bilayer filmcoating thickness

Publication Date：2023-08-25

Online Publishing Date：2025-08-15(First online date of this platform, not the publication date of the document)

Pages：8( 20-27 )

ISTICPKUCSCD

ISSN：2097-1915

Year, Vol.(Issue)：2023,24(4)