A Prediction Method for Storage Life of Conducting Film Resistor Based on Accelerated Degradation Data
CHEN Zhijun
ZHOU Fang
YANG Xueyin
WANG Wei
HU Yanping
ZHANG Tao
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Publication Date：2019-01-01
Online Publishing Date：2025-08-15(First online date of this platform, not the publication date of the document)
Pages：6( 46-51 )