SIMULATION ANALYSIS OF THE VOID LOCATION DURING THE ELECTROMIGRATION BASED ON ATOMIC CONCENTRATION
YANG Jing
JIANG YiMing
CHEN Gang
XU WeiLing
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Publication Date：2020-06-15
Online Publishing Date：2026-09-12(First online date of this platform, not the publication date of the document)
Pages：6( 591-596 )