Comparative Study of MOSFET and IGBT
LIU Chao
LI Huifen
DONG Yinghui
Keywords：junction temperaturepower lossMOSFETIGBT
Publication Date：2013-01-01
Online Publishing Date：2025-08-15(First online date of this platform, not the publication date of the document)
Pages：3( 1772-1773,1849 )