Dynamic Parameter Testing Method for High-speed Integrated Circuits Based on ATE
NIE Zhijun
ZHAO Shuai
Abstract：This paper introduces a test method based on the digital-analog hybrid ATE time measurement unit(TMU),and it is found that the conventional test method will lead to the existence of measurement errors in the TMU,and in order to solve this problem,a digital-analog hybrid ATE programmable oscilloscope method is proposed.To high-speed photocoupler fall time as the object of study,test results show that the optimization of the test value before the existence of a large error,the optimization of the fall time test value and high-speed photocoupler detailed specification of the typical value is basically consistent with the test value of a number of measurements is stable,and has been applied to a number of high-speed integrated circuits in the screening test.
Keywords：high-speed integrated circuitdigital-analog hybrid testing systemtime measurement unit(TMU)program controlscreen
Publication Date：2025-12-20
Online Publishing Date：2026-03-23(First online date of this platform, not the publication date of the document)
Pages：5( 170-174 )