Automatic Test Technology with Complex Programmable Logic Device of Circuit Board
SUN Liping
MENG Fanbo
ZHANG Yunqiang
DING Xiaoling
Abstract：The fault of complex programmable logic device as the core device circuit often leads to failure of the entire circuit function .In this paper ,research status of complex programmable logic device with the domestic and foreign details , and the existing testing method mainly adopted based on analyzing the advantages and disadvantages ,are analyzed to explore the idea and direction .
Keywords：complex logic devicesboundary scanVITALScan Works
Publication Date：2015-01-01
Online Publishing Date：2025-08-15(First online date of this platform, not the publication date of the document)
Pages：4( 15-17,176 )