QTL Mapping of Resistance to Northern Corn Leaf Blight in Maize Inbred Line P178 and Effect Analysis
TIAN Zhiqiang
AI Tangshun
DENG Ce
YOU Shiting
SHI Qin
MA Yalong
LI Zhimin
DING Junqiang
Abstract：For identification of the major quantitative trait loci (QTL) resistant to northern corn leaf blight(NCLB) in maize,an advanced backcross population (BC2F5) including 150 family lines was developed using P178 as resistant donor parent and G41 as susceptible recurrent parent,respectively.The population as well as the parental lines was planted in Lishu,Jilin province and Shuangcheng, Heilongjiang province in 2017 for the evaluation of resistance to NCLB.Significant phenotypic variation in NCLB resistance was observed in both locations. Combined with the construction of genetic map with KASP markers,QTLs of resistance to NCLB were analyzed. In total,six QTLs were identified on chromosomes 1,2,8 and 9,which could explain 4%—23% phenotypic variation.Two stable QTLs were identified on chromosomes 2 and 8,which could be detected in the two environments,while the remaining QTLs conferred resistance to NCLB at a single location.
Keywords：MaizeNorthern corn leaf blightInbred line P178QTL mappingMolecular breeding
Publication Date：2018-01-31
Online Publishing Date：2026-09-12(First online date of this platform, not the publication date of the document)
Pages：5( 73-76,97 )