Research on low-overhead quadruple-node-upsets hardened latch based on DI feedback interlock
WANG Jun
XU Hui
Abstract：With the increase in working frequency and technology of CMOS integrated circuits,deep sub-nano-meter circuits are becoming more susceptible to soft errors caused by radiation particle impacts in high radiation space environments.This paper proposes a low-cost quadruple-node-upsets(QNUs)tolerant latch design,LCQNUTL,which consists of three independent storage units(SC)and an interception module(CG-SIM).Two binary inverters(DI)inside the SC form a feedback interlock loop,which achieves the self-recov-ery capability of single-node flipping in the SC unit by the characteristics of the Dual-inverter(DI).Then,a portion of the error nodes in the storage unit SC is filtered through the CG-SIM.The proposed LCQNUTL latch can completely tolerate QNU.The simulation results also verify the robustness of the LCQNUTL latch.Com-pared with current QNU-tolerant latch designs of the same type,the power consumption is reduced by an aver-age of 53.21%,the delay is reduced by an average of 53.83%,PDP is reduced by an average of 77.27%.
Keywords：radiationsoft errorlatch designquadruple-node-upset
Publication Date：2024-04-28
Online Publishing Date：2025-08-15(First online date of this platform, not the publication date of the document)
Pages：10( 54-62,84 )