Multiple transmission electron microscopic image stitching based on sift features
LI Mu
LU Yanmeng
HAN Shuaihu
WU Zhuobin
CHEN Jiajing
LIU Zhexing
CAO Lei
Abstract：We proposed a new stitching method based on sift features to obtain an enlarged view of transmission electron microscopic (TEM) images with a high resolution. The sift features were extracted from the images, which were then combined with fitted polynomial correction field to correct the images, followed by image alignment based on the sift features. The image seams at the junction were finally removed by Poisson image editing to achieve seamless stitching, which was validated on 60 local glomerular TEM images with an image alignment error of 62.5 to 187.5 nm. Compared with 3 other stitching methods, the proposed method could effectively reduce image deformation and avoid artifacts to facilitate renal biopsy pathological diagnosis.
Keywords：image stitchingsift featuresimage correctionimage alignmentPoisson image editinghigh resolutionlarge view
Publication Date：2015-01-01
Online Publishing Date：2025-08-15(First online date of this platform, not the publication date of the document)
Pages：7( 1251-1257 )