Compensation capacitor fault diagnosis method based on time-frequency enhanced residual network
CHEN Guangwu
CHEN Jun
SHI Jianqiang
LI Peng
Abstract:To address the issue of low fault diagnosis accuracy in existing compensation capacitor fault diagnosis methods for track circuits under high noise interference in complex environments,an intelli-gent fault diagnosis algorithm based on transfer learning,Continuous Wavelet Transform(CWT),and Time-Frequency Enhanced Residual Network(TFEResNet)is proposed.First,CWT is employed to integrate the time-domain and frequency-domain information of the original induced voltage signal,generating a wavelet time-frequency map.This map effectively enhances the model's ability to cap-ture fault characteristics by mapping compensation capacitor fault features to local positions at different times and scales.The wavelet time-frequency map is then input into the constructed TFEResNet model for transfer learning training,which is used for feature extraction and fault classification.TFER-esNet can extract complex time-frequency features from the map,mitigating the adverse effects of re-dundant and irrelevant noise in the signal,thereby improving diagnosis accuracy and generalization ca-pability of the model.Experimental results show that,in high-noise environments,the proposed algo-rithm outperforms other methods in compensation capacitor fault diagnosis,achieving an accuracy of 99.28%.Additionally,it shows superior performance in precision,recall,and F1-score,demonstrat-ing the effectiveness of the method and providing a novel approach for data-driven compensation ca-pacitor fault diagnosis in track circuits.
Keywords:track circuittime-frequency enhanced residual networktransfer learningcompensation capacitor fault diagnosisContinuous Wavelet Transform(CWT)
Publication Date:2024-10-28
Online Publishing Date:2025-08-15(First online date of this platform, not the publication date of the document)
Pages:12( 130-141 )
Journal of Beijing Jiaotong University

Journal of Beijing Jiaotong University

ISTICPKUCSCD
ISSN:1673-0291
Year, Vol.(Issue):2024,48(5)